Xin Zhang, Koichi Ishida, Hiroshi Fuketa, Makoto Takamiya, Takayasu Sakurai. On-Chip Measurement System for Within-Die Delay Variation of Individual Standard Cells in 65-nm CMOS. IEEE Trans. VLSI Syst., 20(10):1876-1880, 2012. [doi]
@article{ZhangIFTS12,
title = {On-Chip Measurement System for Within-Die Delay Variation of Individual Standard Cells in 65-nm CMOS},
author = {Xin Zhang and Koichi Ishida and Hiroshi Fuketa and Makoto Takamiya and Takayasu Sakurai},
year = {2012},
doi = {10.1109/TVLSI.2011.2162257},
url = {http://dx.doi.org/10.1109/TVLSI.2011.2162257},
researchr = {https://researchr.org/publication/ZhangIFTS12},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {20},
number = {10},
pages = {1876-1880},
}