On-Chip Measurement System for Within-Die Delay Variation of Individual Standard Cells in 65-nm CMOS - researchr publication

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Xin Zhang, Koichi Ishida, Hiroshi Fuketa, Makoto Takamiya, Takayasu Sakurai. On-Chip Measurement System for Within-Die Delay Variation of Individual Standard Cells in 65-nm CMOS. IEEE Trans. VLSI Syst., 20(10):1876-1880, 2012. [doi]

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