Multi-criteria Dynamic Scheduling Methodology for Controlling a Semiconductor Wafer Fabrication System - researchr publication authors

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Huai Zhang, Zhibin Jiang, Hongtao Hu 0001. Multi-criteria Dynamic Scheduling Methodology for Controlling a Semiconductor Wafer Fabrication System. In IEEE Conference on Automation Science and Engineering, CASE 2007, September 22-25, 2007. Scottsdale, Arizona, USA. pages 213-218, IEEE, 2007. [doi]

This author has not been identified. Look up 'Huai Zhang' in GoogleThis author has not been identified. Look up 'Zhibin Jiang' in GoogleThis author has not been identified. Look up 'Hongtao Hu 0001' in Google

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