Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu, Rob A. Rutenbar. Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 47-54, IEEE, 2010. [doi]
Abstract is missing.