Machine learning based soft error rate estimation of pass transistor logic in high-speed communication

Zhe Zhang, Jan Lappas, André Lucas Chinazzo, Christian Weis, Zhihang Wu, Leibin Ni, Norbert Wehn, Mehdi B. Tahoori. Machine learning based soft error rate estimation of pass transistor logic in high-speed communication. In IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022. pages 1-4, IEEE, 2022. [doi]

Abstract

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