Z. J. Zhang, Q. Li, Z. Y. Dong, W. T. Wang, S. T. Lai, X. Yang, F. Liang, C. L. Wang, C. Luo, L. J. Lyu, Z. Li, J. M. Xu, X. Wu. Microscopic Characterization of Failure Mechanisms in Long-Term Implanted Microwire Neural Electrodes. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-5, IEEE, 2023. [doi]
@inproceedings{ZhangLDWLYLWLLLXW23,
title = {Microscopic Characterization of Failure Mechanisms in Long-Term Implanted Microwire Neural Electrodes},
author = {Z. J. Zhang and Q. Li and Z. Y. Dong and W. T. Wang and S. T. Lai and X. Yang and F. Liang and C. L. Wang and C. Luo and L. J. Lyu and Z. Li and J. M. Xu and X. Wu},
year = {2023},
doi = {10.1109/IRPS48203.2023.10117971},
url = {https://doi.org/10.1109/IRPS48203.2023.10117971},
researchr = {https://researchr.org/publication/ZhangLDWLYLWLLLXW23},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}