Z. J. Zhang, Q. Li, Z. Y. Dong, W. T. Wang, S. T. Lai, X. Yang, F. Liang, C. L. Wang, C. Luo, L. J. Lyu, Z. Li, J. M. Xu, X. Wu. Microscopic Characterization of Failure Mechanisms in Long-Term Implanted Microwire Neural Electrodes. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.