Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern - researchr publication authors

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Hong Zhang, Huaguo Liang, Jiewen Hu, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang. Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern. Microelectronics Journal, 138:105841, 2023. [doi]

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