Hong Zhang, Huaguo Liang, Jiewen Hu, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang. Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern. Microelectronics Journal, 138:105841, 2023. [doi]
@article{ZhangLHSYLH23,
title = {Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern},
author = {Hong Zhang and Huaguo Liang and Jiewen Hu and Zhiwei Shao and Maoxiang Yi and Yingchun Lu and Zhengfeng Huang},
year = {2023},
doi = {10.1016/j.mejo.2023.105841},
url = {https://doi.org/10.1016/j.mejo.2023.105841},
researchr = {https://researchr.org/publication/ZhangLHSYLH23},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {138},
pages = {105841},
}