Automatic Test Program Generation Using Executing-Trace-Based Constraint Extraction for Embedded Processors

Ying Zhang, Huawei Li, Xiaowei Li 0001. Automatic Test Program Generation Using Executing-Trace-Based Constraint Extraction for Embedded Processors. IEEE Trans. VLSI Syst., 21(7):1220-1233, 2013. [doi]

Abstract

Abstract is missing.