Zuodong Zhang, Meng Li 0004, Yibo Lin, Runsheng Wang, Ru Huang. READ: Reliability-Enhanced Accelerator Dataflow Optimization using Critical Input Pattern Reduction. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023. pages 1-2, IEEE, 2023. [doi]
Abstract is missing.