Q. Zhang, Juin J. Liou, John McMacken, Kevin Stiles, J. Ross Thomson, Paul Layman. An efficient and practical MOS statistical model for digital applications. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 433-436, IEEE, 2000. [doi]
Abstract is missing.