Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference

Wangyang Zhang, Xin Li, Rob A. Rutenbar. Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 262-267, ACM, 2010. [doi]

Abstract

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