Grace Li Zhang, Bing Li, Ulf Schlichtmann. Sampling-based buffer insertion for post-silicon yield improvement under process variability. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 1457-1460, IEEE, 2016. [doi]
Abstract is missing.