Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient

Xiaoyu Zhang, Bin Liang, Ruiqiang Song. Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient. In 13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019. pages 1-4, IEEE, 2019. [doi]

Abstract

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