Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology - researchr publication authors

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Chenyu Zhang, Yan Li 0084, Wenfa Zhan, Wenping Geng, Ting Liang, Xiaoyang Zeng. Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology. Microelectronics Journal, 143:106055, January 2024. [doi]

This author has not been identified. Look up 'Chenyu Zhang' in GoogleThis author has not been identified. Look up 'Yan Li 0084' in GoogleThis author has not been identified. Look up 'Wenfa Zhan' in GoogleThis author has not been identified. Look up 'Wenping Geng' in GoogleThis author has not been identified. Look up 'Ting Liang' in GoogleThis author has not been identified. Look up 'Xiaoyang Zeng' in Google

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