Chenyu Zhang, Yan Li 0084, Wenfa Zhan, Wenping Geng, Ting Liang, Xiaoyang Zeng. Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology. Microelectronics Journal, 143:106055, January 2024. [doi]
@article{ZhangLZGLZ24,
title = {Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology},
author = {Chenyu Zhang and Yan Li 0084 and Wenfa Zhan and Wenping Geng and Ting Liang and Xiaoyang Zeng},
year = {2024},
month = {January},
doi = {10.1016/j.mejo.2023.106055},
url = {https://doi.org/10.1016/j.mejo.2023.106055},
researchr = {https://researchr.org/publication/ZhangLZGLZ24},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {143},
pages = {106055},
}