Baogang Zhang, M. G. Sarwar Murshed, Faraz Hussain, Rickard Ewetz. Fast Resilient-Aware Data Layout Organization for Resistive Computing Systems. In 2020 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2020, Limassol, Cyprus, July 6-8, 2020. pages 72-77, IEEE, 2020. [doi]
@inproceedings{ZhangMHE20,
title = {Fast Resilient-Aware Data Layout Organization for Resistive Computing Systems},
author = {Baogang Zhang and M. G. Sarwar Murshed and Faraz Hussain and Rickard Ewetz},
year = {2020},
doi = {10.1109/ISVLSI49217.2020.00023},
url = {https://doi.org/10.1109/ISVLSI49217.2020.00023},
researchr = {https://researchr.org/publication/ZhangMHE20},
cites = {0},
citedby = {0},
pages = {72-77},
booktitle = {2020 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2020, Limassol, Cyprus, July 6-8, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5775-7},
}