Baogang Zhang, M. G. Sarwar Murshed, Faraz Hussain, Rickard Ewetz. Fast Resilient-Aware Data Layout Organization for Resistive Computing Systems. In 2020 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2020, Limassol, Cyprus, July 6-8, 2020. pages 72-77, IEEE, 2020. [doi]
Abstract is missing.