Runtime Self-Calibrated Temperature-Stress Cosensor for 3-D Integrated Circuits

Chun Zhang, Dian Ma, Changzhi Li, Yiyu Shi. Runtime Self-Calibrated Temperature-Stress Cosensor for 3-D Integrated Circuits. IEEE Trans. VLSI Syst., 22(11):2411-2417, 2014. [doi]

Abstract

Abstract is missing.