Fengming Zhang, Warren Necoechea, Peter Reiter, Yong-Bin Kim, Fabrizio Lombardi. Load Board Designs Using Compound Dot Technique and Phase Detector for Hierarchical ATE Calibrations. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 486-494, IEEE Computer Society, 2006. [doi]
@inproceedings{ZhangNRKL06,
title = {Load Board Designs Using Compound Dot Technique and Phase Detector for Hierarchical ATE Calibrations},
author = {Fengming Zhang and Warren Necoechea and Peter Reiter and Yong-Bin Kim and Fabrizio Lombardi},
year = {2006},
doi = {10.1109/DFT.2006.38},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.38},
researchr = {https://researchr.org/publication/ZhangNRKL06},
cites = {0},
citedby = {0},
pages = {486-494},
booktitle = {21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2706-X},
}