Fengming Zhang, Warren Necoechea, Peter Reiter, Yong-Bin Kim, Fabrizio Lombardi. Load Board Designs Using Compound Dot Technique and Phase Detector for Hierarchical ATE Calibrations. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 486-494, IEEE Computer Society, 2006. [doi]
Abstract is missing.