Probabilistic Analysis and Design of Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits

Jie Zhang, N. P. Patil, Subhasish Mitra. Probabilistic Analysis and Design of Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 28(9):1307-1320, 2009. [doi]

Abstract

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