Optimized bit extraction of SVC exploiting linear error model

Wenyao Zhang, Jun Sun, Jiaying Liu, Zongming Guo. Optimized bit extraction of SVC exploiting linear error model. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 1887-1890, IEEE, 2012. [doi]

Abstract

Abstract is missing.