A No-Reference Deep Learning Quality Assessment Method for Super-Resolution Images Based on Frequency Maps

Zicheng Zhang, Wei Sun 0029, Xiongkuo Min, Wenhan Zhu, Tao Wang 0078, Wei Lu 0021, Guangtao Zhai. A No-Reference Deep Learning Quality Assessment Method for Super-Resolution Images Based on Frequency Maps. In IEEE International Symposium on Circuits and Systems, ISCAS 2022, Austin, TX, USA, May 27 - June 1, 2022. pages 3170-3174, IEEE, 2022. [doi]

Abstract

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