Sparse statistical model inference for analog circuits under process variations - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Yan Zhang, Sriram Sankaranarayanan, Fabio Somenzi. Sparse statistical model inference for analog circuits under process variations. In 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014. pages 449-454, IEEE, 2014. [doi]

This author has not been identified. Look up 'Yan Zhang' in GoogleThis author has not been identified. It may be one of the following persons:

Sriram Sankaranarayanan

Look up 'Sriram Sankaranarayanan' in GoogleThis author has not been identified. Look up 'Fabio Somenzi' in Google

runs on WebDSL