Sparse statistical model inference for analog circuits under process variations

Yan Zhang, Sriram Sankaranarayanan, Fabio Somenzi. Sparse statistical model inference for analog circuits under process variations. In 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014. pages 449-454, IEEE, 2014. [doi]

Abstract

Abstract is missing.