From statistical model checking to statistical model inference: characterizing the effect of process variations in analog circuits - researchr publication authors

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Yan Zhang, Sriram Sankaranarayanan, Fabio Somenzi, Xin Chen 0002, Erika Ábrahám. From statistical model checking to statistical model inference: characterizing the effect of process variations in analog circuits. In Jörg Henkel, editor, The IEEE/ACM International Conference on Computer-Aided Design, ICCAD'13, San Jose, CA, USA, November 18-21, 2013. pages 662-669, IEEE/ACM, 2013. [doi]

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Sriram Sankaranarayanan

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