Yan Zhang, Sriram Sankaranarayanan, Fabio Somenzi, Xin Chen 0002, Erika Ábrahám. From statistical model checking to statistical model inference: characterizing the effect of process variations in analog circuits. In Jörg Henkel, editor, The IEEE/ACM International Conference on Computer-Aided Design, ICCAD'13, San Jose, CA, USA, November 18-21, 2013. pages 662-669, IEEE/ACM, 2013. [doi]
Abstract is missing.