Wenbin Zhang, Jianshi Tang, Bin Gao 0006, Wen Sun, Wei Liu, Kanwen Wang, Wei Wu, He Qian, Huaqiang Wu. Impact of Bottom Electrode Roughness on the Analog Switching Characteristics in Nanoscale RRAM Array. In Device Research Conference, DRC 2021, Santa Barbara, CA, USA, June 20-23, 2021. pages 1-2, IEEE, 2021. [doi]
Abstract is missing.