Characterizing and evaluating voltage noise in multi-core near-threshold processors - researchr publication authors

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Xuan Zhang, Tao Tong, Svilen Kanev, Sae Kyu Lee, Gu-Yeon Wei, David Brooks. Characterizing and evaluating voltage noise in multi-core near-threshold processors. In International Symposium on Low Power Electronics and Design (ISLPED), Beijing, China, September 4-6, 2013. pages 82-87, IEEE, 2013. [doi]

This author has not been identified. Look up 'Xuan Zhang' in GoogleThis author has not been identified. Look up 'Tao Tong' in GoogleThis author has not been identified. Look up 'Svilen Kanev' in GoogleThis author has not been identified. Look up 'Sae Kyu Lee' in GoogleThis author has not been identified. Look up 'Gu-Yeon Wei' in GoogleThis author has not been identified. Look up 'David Brooks' in Google

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