Characterizing and evaluating voltage noise in multi-core near-threshold processors

Xuan Zhang, Tao Tong, Svilen Kanev, Sae Kyu Lee, Gu-Yeon Wei, David Brooks. Characterizing and evaluating voltage noise in multi-core near-threshold processors. In International Symposium on Low Power Electronics and Design (ISLPED), Beijing, China, September 4-6, 2013. pages 82-87, IEEE, 2013. [doi]

Abstract

Abstract is missing.