Xuan Zhang, Tao Tong, Svilen Kanev, Sae Kyu Lee, Gu-Yeon Wei, David Brooks. Characterizing and evaluating voltage noise in multi-core near-threshold processors. In International Symposium on Low Power Electronics and Design (ISLPED), Beijing, China, September 4-6, 2013. pages 82-87, IEEE, 2013. [doi]
@inproceedings{ZhangTKLWB13,
title = {Characterizing and evaluating voltage noise in multi-core near-threshold processors},
author = {Xuan Zhang and Tao Tong and Svilen Kanev and Sae Kyu Lee and Gu-Yeon Wei and David Brooks},
year = {2013},
doi = {10.1109/ISLPED.2013.6629271},
url = {http://dx.doi.org/10.1109/ISLPED.2013.6629271},
researchr = {https://researchr.org/publication/ZhangTKLWB13},
cites = {0},
citedby = {0},
pages = {82-87},
booktitle = {International Symposium on Low Power Electronics and Design (ISLPED), Beijing, China, September 4-6, 2013},
publisher = {IEEE},
}