A probabilistic framework to estimate full-chips subthreshold leakage power distribution considering within-die and die-to-die P-T-V variations

Songqing Zhang, Vineet Wason, Kaustav Banerjee. A probabilistic framework to estimate full-chips subthreshold leakage power distribution considering within-die and die-to-die P-T-V variations. In Rajiv V. Joshi, Kiyoung Choi, Vivek Tiwari, Kaushik Roy, editors, Proceedings of the 2004 International Symposium on Low Power Electronics and Design, 2004, Newport Beach, California, USA, August 9-11, 2004. pages 156-161, ACM, 2004. [doi]

Abstract

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