BIST approach for testing configurable logic and memory resources in FPGAs - researchr publication authors

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Zhiquan Zhang, Zhiping Wen, Lei Chen, Tao Zhou, Fan Zhang. BIST approach for testing configurable logic and memory resources in FPGAs. In IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008. pages 1767-1770, IEEE, 2008. [doi]

This author has not been identified. Look up 'Zhiquan Zhang' in GoogleThis author has not been identified. Look up 'Zhiping Wen' in GoogleThis author has not been identified. Look up 'Lei Chen' in GoogleThis author has not been identified. Look up 'Tao Zhou' in GoogleThis author has not been identified. Look up 'Fan Zhang' in Google

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