Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty. Physical defect modeling for fault insertion in system reliability test. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
@inproceedings{ZhangWGC09-0,
title = {Physical defect modeling for fault insertion in system reliability test},
author = {Zhaobo Zhang and Zhanglei Wang and Xinli Gu and Krishnendu Chakrabarty},
year = {2009},
doi = {10.1109/TEST.2009.5355715},
url = {http://dx.doi.org/10.1109/TEST.2009.5355715},
researchr = {https://researchr.org/publication/ZhangWGC09-0},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}