Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty. Physical defect modeling for fault insertion in system reliability test. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
Abstract is missing.