Yucong Zhang, Xiaoqin Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Hans-Joachim Wunderlich, Jun Qian. Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 149-154, IEEE, 2018. [doi]
Abstract is missing.