FPGA-based failure mode testing and analysis for MLC NAND flash memory - researchr publication authors

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Meng Zhang, Fei Wu, He Huang, Qian Xia, Jian Zhou, Changsheng Xie. FPGA-based failure mode testing and analysis for MLC NAND flash memory. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 434-439, IEEE, 2017. [doi]

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