Zuodong Zhang, Renjie Wei, Meng Li 0004, Yibo Lin, Runsheng Wang, Ru Huang. READ: Reliability-Enhanced Accelerator Dataflow Optimization Using Critical Input Pattern Reduction. In IEEE/ACM International Conference on Computer Aided Design, ICCAD 2023, San Francisco, CA, USA, October 28 - Nov. 2, 2023. pages 1-9, IEEE, 2023. [doi]
Abstract is missing.