FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Bin Zhang, Wei-Shen Wang, Michael Orshansky. FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 755-760, IEEE Computer Society, 2006. [doi]

This author has not been identified. Look up 'Bin Zhang' in GoogleThis author has not been identified. Look up 'Wei-Shen Wang' in GoogleThis author has not been identified. Look up 'Michael Orshansky' in Google

runs on WebDSL