Bin Zhang, Wei-Shen Wang, Michael Orshansky. FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 755-760, IEEE Computer Society, 2006. [doi]
@inproceedings{ZhangWO06,
title = {FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs},
author = {Bin Zhang and Wei-Shen Wang and Michael Orshansky},
year = {2006},
doi = {10.1109/ISQED.2006.64},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.64},
tags = {rule-based, analysis},
researchr = {https://researchr.org/publication/ZhangWO06},
cites = {0},
citedby = {0},
pages = {755-760},
booktitle = {7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2523-7},
}