Highly stable data SRAM-PUF in 65nm CMOS process

Xuelong Zhang, Pengjun Wang, Yuejun Zhang. Highly stable data SRAM-PUF in 65nm CMOS process. In IEEE 10th International Conference on ASIC, ASICON 2013, Shenzhen, China, October 28-31, 2013. pages 1-4, IEEE, 2013. [doi]

Abstract

Abstract is missing.