Persistent and Nonpersistent Error Optimization for STT-RAM Cell Design

Yaojun Zhang, Bonan Yan, XiaoBin Wang, Yiran Chen. Persistent and Nonpersistent Error Optimization for STT-RAM Cell Design. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(7):1181-1192, 2017. [doi]

Abstract

Abstract is missing.