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An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation

Wangyang Zhang, Wenjian Yu, Zeyi Wang, Zhiping Yu, Rong Jiang, Jinjun Xiong. An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008. pages 580-585, 2008. [doi]

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