Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network - researchr publication authors

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Wanping Zhang, Yi Zhu, Wenjian Yu, Ling Zhang, Rui Shi, He Peng, Zhi Zhu, Lew Chua-Eoan, Rajeev Murgai, Toshiyuki Shibuya, Nuriyoki Ito, Chung-Kuan Cheng. Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008. pages 537-540, 2008. [doi]

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