Wanping Zhang, Yi Zhu, Wenjian Yu, Ling Zhang, Rui Shi, He Peng, Zhi Zhu, Lew Chua-Eoan, Rajeev Murgai, Toshiyuki Shibuya, Nuriyoki Ito, Chung-Kuan Cheng. Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008. pages 537-540, 2008. [doi]
@inproceedings{ZhangZYZSPZCMSIC08,
title = {Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network},
author = {Wanping Zhang and Yi Zhu and Wenjian Yu and Ling Zhang and Rui Shi and He Peng and Zhi Zhu and Lew Chua-Eoan and Rajeev Murgai and Toshiyuki Shibuya and Nuriyoki Ito and Chung-Kuan Cheng},
year = {2008},
doi = {10.1109/DATE.2008.4484906},
url = {http://dx.doi.org/10.1109/DATE.2008.4484906},
researchr = {https://researchr.org/publication/ZhangZYZSPZCMSIC08},
cites = {0},
citedby = {0},
pages = {537-540},
booktitle = {Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008},
}