A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits

Chong Zhao, Xiaoliang Bai, Sujit Dey. A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits. In Sharad Malik, Limor Fix, Andrew B. Kahng, editors, Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004. pages 894-899, ACM, 2004. [doi]

Abstract

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