Chong Zhao, Sujit Dey. Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO). In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 133-140, IEEE Computer Society, 2006. [doi]
Abstract is missing.