Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip - researchr publication authors

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Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma. Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 11-17, IEEE Computer Society, 2003. [doi]

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